Naresh Kumar Emani   Powered by Cvitae.org
Naresh Kumar Emani




Naresh Kumar Emani
Engineer, Taiwan Semiconductor Manufacturing Company
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About me:
Hi, I belong to Hyderabad, India. Studied at different places and finally at IIT Bombay. Currently working at TSMC, Taiwan.
My interests are Swimming and Music
Contact Information:
Hsinchu, 300, Taiwan
 

Resume

last modified 2008-05-16 18:19:01

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CVitae -

NARESH KUMAR EMANI

- nkemani - tsmc - com


OBJECTIVE

 
Planning graduate study in Autumn 2009
  

EDUCATION

07/'05 - 08/'07

Indian Institute of Technology Bombay, Master of Technology (EE) Mumbai, INDIA
  • GPA - 9.63/10, Specialization in Microelectronics

06/'03 - 03/'05

Sri Sathya Sai University, Master of Science (Physics) Prashanthi Nilayam, INDIA
  • GPA- 5.00/5.00, Specialization in Photonics

06/'00 - 03/'03

Sri Sathya Sai University, Bachelor of Science ) Prashanthi Nilayam, INDIA
  • GPA - 4.92/5.00, Honours in Physics

EXPERIENCE

08/'07 - present

 Engineer, Taiwan Semiconductor Manufacturing Company Hsinchu, Taiwan
  • I work in Advanced Reliability Development Program responsible for developing reliability methodologies for advanced technologies nodes like N45 and N32.

06/'06 - 06/'07

Master's Student, IIT Bombay
  • Developed an Ultra fast measurement system for measurement of NBTI degradation which enables monitoring of drain current for about 9 decades in time(us~ks). This work enabled investigation of material dependence of NBTI physical mechanism.

08/'04 - 03/'05

Master's Student, Sri Sathya Sai University
  • Worked on Fiber Optic sensor using Frequency Modulated Continuous Wave technique in two mode fiber.

AWARDS

ALL INDIA RANK 1 in GATE(Physics) 2005
UGC-CSIR JRF Fellowship Dec 2004, June 2005

SKILLS, TECHNOLOGIES & PROJECTS

Physics: Modelling and Simulation
Programming: C,CPP,Matlab,Perl
Languages,Swmming and Yoga

PUBLICATIONS

"Material Dependence of NBTI Physical Mechanism in Silicon Oxynitride (SiON) p-MOSFETs: A Comprehensive Study by Ultra-Fast On-The-Fly (UF-OTF) IDLIN Technique” – First Author, E. N. Kumar, V. D. Maheta, S. Purawat, A. E. Islam, C. Olsen, K. Ahmed, M. A. Alam and S. Mahapatra, International Electron Devices Meeting (IEDM), Washington DC, USA, Dec 2007
Theory and Practice of Ultra-fast Measurements for NBTI Degradation: Challenges and Opportunities, A.E. Islam, E. N. Kumar, H. Das, S. Purawat, V. Maheta, H. Aono, E. Murakami, S. Mahapatra, and M.A. Alam, International Electron Devices Meeting (IEDM), Washington DC, USA, Dec 2007

REFERENCES

Connections

OFFLINE Dirk Englund
 

Pictures

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